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Schuessler, M. and Krozer, and Bock, and Brandt, and Vecchi, and Losi, and Hartnagel, Hans L. (1996):
Pulsed stress reliability investigations of Schottky diodes and HBTs.
In: Microelectronics and reliability. 36 (1996), S. 1907-1910, [Article]

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