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Article

Schuessler, M. ; Krozer, ; Bock, ; Brandt, ; Vecchi, ; Losi, ; Hartnagel, Hans L. (1996):
Pulsed stress reliability investigations of Schottky diodes and HBTs.
In: Microelectronics and reliability. 36 (1996), S. 1907-1910, [Article]

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