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Number of items: 3.

Conradi, T. and Hubenthal, and Röll, and Stobiecki, and Thoma, and Berg, and Broszeit, and Bauer, and Bock, (1998):
Spannungsanisotropie und Strukturen von TiN-Schichten.
In: Materialwissenschaft und Werkstofftechnik. 29 (1998), 9, S. 476-483, [Article]

Brandt, Michael and Krozer, and Schüßler, and Bock, and Hartnagel, (1996):
Characterisation of reliability of compound semiconductor devices using electrical pulses.
In: Microelectronics and reliability. 36 (1996), S. 1891-1894, [Article]

Schuessler, M. and Krozer, and Bock, and Brandt, and Vecchi, and Losi, and Hartnagel, Hans L. (1996):
Pulsed stress reliability investigations of Schottky diodes and HBTs.
In: Microelectronics and reliability. 36 (1996), S. 1907-1910, [Article]

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