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Number of items: 6.

Krozer, Viktor and Brandt, and Schüßler, and Hartnagel, (1998):
Application of transmission line pulses for reliability characterisation of high temperature devices.
In: HiTEC´98: High -Temperature Electronics Conference <1998, Albuquerque>: Proceedings. S. 138-143, [Conference or Workshop Item]

Hartnagel, Hans L. and Brandt, and Dehé, and Simon, (1998):
Mikro-Sensorik für den Einsatz in Maschinen bis hin zum Satelliten.
In: Thema Forschung. 1998, H. 1, S. 14-21, [Article]

Vogt, Alexander and Brandt, and Sigurdardottir, A. and Schüßler, and Pena, and Simon, and Hartnagel, H. L. and Rodewald, and Roesner, (1997):
Characterisation of degradation mechanisms in resonant tunneling diodes.
In: European Symposium of Electron Devices, Failure Physics and Analysis <8, 1997, Arcachon, France>: Proceedings. S. 1691-1694, [Conference or Workshop Item]

Vogt, Alexander and Brandt, and Sigurdardottir, A. and Schüssler, and Pena, and Simon, and Hartnagel, H. L. and Rodewald, and Roesner, (1997):
Characterisation of degradation mechanisms in resonant tunnelling diodes.
In: Microelectronics and reliability. 37 (1997), S. 1691-1694, [Article]

Schüßler, Martin and Krozer, and Bock, and Brandt, and Vecchi, and Losi, and Hartnagel, Hans L. (1996):
Pulsed stress reliability investigations of Schottky diodes and HBTs.
In: Microelectronics and reliability. 36 (1996), S. 1907-1910, [Article]

Vogt, Alexander and Brandt, and Pena, and Aller, and Hartnagel, (1996):
Wachstum und Zuverlässigkeit von resonanten Tunneldioden.
In: Molecular Beam Epitaxy Workshop <1996, Frankfurt/Oder>: Proceedings, [Conference or Workshop Item]

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