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Number of items: 14.

Brandt, Michael and Krozer, and Schüßler, and Lin, and Simon, and Vogt, and Rodriguez, and Parmeggiani, and Grajal, (1998):
Application of transmission line pulsed (TLP) stress for thermal and reliability characterisation of compound semiconductor devices.
In: Reliability Center of Japan (RCJ) Symposium <1998, Tokyo>: Proceedings, [Conference or Workshop Item]

Brandt, Michael and Schüßler, and Krozer, and Grajal, and Hartnagel, (1997):
Transmission line pulse based reliability investigations of HBTs.
In: European Gallium Arsenide and Related III-V Compounds Applications Symposium <5, 1997, Bologna, Italy>: Proceedings. S. 105-108, [Conference or Workshop Item]

Brandt, Michael and Krozer, and Schüßler, and Bock, and Hartnagel, (1996):
Characterisation of reliability of compound semiconductor devices using electrical pulses.
In: Microelectronics and reliability. 36 (1996), S. 1891-1894, [Article]

Fricke, K. and Krozer, and Schüßler, (1996):
Comparison of MESFET, HEMT, and HBT device performance at high temperatures.
In: High - Temperature Electronics Conference <1996, Albuquerque, NM, USA>: Proceedings, [Conference or Workshop Item]

Schüßler, Martin and Statzner, and Lin, and Krozer, and Horn, and Hartnagel, Hans L. (1996):
Electrochemical deposition of Pd, Ti, and Ge for applications in GaAs technology.
In: Journal of the Electrochemical Society. 143 (1996), No. 4, S. 73-75, [Article]

Dehé, Alfons and Klingbeil, and Krozer, and Fricke, and Beilenhoff, and Hartnagel, (1996):
GaAs integrated thermoelectric microwave power sensor.
In: Workshop on Compound Semiconductor Devices and Integrated Circuits <20, 1996, Vilnius, Lithuania>: Proceedings. S. 126-127, [Conference or Workshop Item]

Dehé, Alfons and Klingbeil, and Krozer, and Fricke, and Beilenhoff, and Hartnagel, (1996):
GaAs monolithic integrated microwave power sensor in coplanar waveguide technology.
In: IEEE MTT-S International Microwave Symposium <1996>: Digest. S. 161-164, [Conference or Workshop Item]

Dehé, Alfons and Krozer, and Chen, and Hartnagel, (1996):
High-sensitivity microwave power sensor for GaAs-MMIC implementation.
In: Electronic letters. 32 (1996), No. 23, S. 2149-2150, [Article]

Schüßler, Martin and Krozer, and Bock, and Brandt, and Vecchi, and Losi, and Hartnagel, Hans L. (1996):
Pulsed stress reliability investigations of Schottky diodes and HBTs.
In: Microelectronics and reliability. 36 (1996), S. 1907-1910, [Article]

Pantoja, J. M. M. and Grüb, Andreas and Krozer, and Franco, (1995):
Accuracy of nonoscillating one-port noise measurements.
In: IEEE Transactions on instrumentation and measurement. 44 (1995), No. 4, S. 853-859, [Article]

Schüßler, Martin and Krozer, and Pfeiffer, and Statzner, and Lee, and Hartnagel, Hans L. (1995):
AlGaAs/GaAs and GaInP/GaAs HBT for high temperature microwave operation.
In: International Symposium on Signals, Systems and Electronics: ISSE '95 <1995, San Francisco, USA>: Proceedings, [Conference or Workshop Item]

Fricke, Klaus and Krozer, and Hartnagel, (1995):
III-V semiconductor properties for high temperature electronics.
In: Materials science and engineering. B 29 (1995), S. 47-53, [Article]

Grüb, Andreas and Simon, and Krozer, and Lin, and Shaalan, and Beilenhoff, and Sigurdardottir, A. and Hartnagel, H. L. (1995):
Terahertz research at TH Darmstadt.
In: International Workshop on Terahertz Electronics <3, 1995, Zermatt, Schweiz>: Proceedings, [Conference or Workshop Item]

Fricke, Klaus and Krozer, and Hartnagel, (1995):
Theromdynamics of microwave devices.
In: Handbook of microwave technology. Hrsg.: T. Koryu Ishii. Vol. 2. Kap. 36, Orlando, Academic Press 1995, [Book Section]

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