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Dietz, C. ; Zerson, M. ; Riesch, C. ; Gigler, A. M. ; Stark, R. W. ; Rehse, N. ; Magerle, R. (2008)
Nanotomography with enhanced resolution using bimodal atomic force microscopy.
In: Applied Physics Letters, 92 (14)
doi: 10.1063/1.2907500
Article, Bibliographie

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