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Dietz, C. ; Zerson, M. ; Riesch, C. ; Gigler, A. M. ; Stark, R. W. ; Rehse, N. ; Magerle, R. (2008):
Nanotomography with enhanced resolution using bimodal atomic force microscopy.
In: Applied Physics Letters, 92 (14), p. 143107. American Institute of Physics, ISSN 0003-6951,
DOI: 10.1063/1.2907500,
[Article]

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