Artikel

Tanaka, I. ; Kleebe, H.-J. ; Cinibulk, M. K. ; Bruley, J. ; Clarke, D. R. ; Rühle, M. (2005)
Calcium-Concentration Dependence of the Intergranular Film Thickness in Silicon-Nitride.
In: Journal of the American Ceramic Society, 77 (4)
doi: 10.1111/j.1151-2916.1994.tb07246.x
Artikel, Bibliographie

Tanaka, I. ; Igashira, K. ; Kleebe, H.-J. ; Rühle, M. (2005)
High-Temperature Strength of Fluorine-Doped Silicon-Nitride.
In: Journal of the American Ceramic Society, 77 (1)
doi: 10.1111/j.1151-2916.1994.tb06990.x
Artikel, Bibliographie

Kleebe, H.-J. ; Cinibulk, M. K. ; Cannon, R. M. ; Rühle, M. (2005)
Statistical-Analysis of the Intergranular Film Thickness In Silicon-Nitride Ceramics.
In: Journal of the American Ceramic Society, 76 (8)
doi: 10.1111/j.1151-2916.1993.tb08319.x
Artikel, Bibliographie

Prielipp, Helge ; Knechtel, Mathias ; Claussen, Nils ; Streiffer, S. K. ; Müllejans, H. ; Rühle, M. ; Rödel, Jürgen (1995)
Strength and fracture toughness of a aluminum/alumina composites with interpenetrating networks.
In: Materials science and engineering. A, 197 (1)
doi: 10.1016/0921-5093(94)09771-2
Artikel, Bibliographie

Kaplan, Wayne D. ; Müllejans, H. ; Rühle, M. ; Rödel, Jürgen ; Claussen, Nils (1995)
Ca segregation to basal surface in Alpha-alumina.
In: Journal of the American Ceramical Society. 78 (1995), No. 10, S. 2841-2844, 78 (10)
doi: 10.1111/j.1151-2916.1995.tb08064.x
Artikel, Bibliographie

Mayer, J. ; Szabó, V. ; Rühle, M. ; Seher, M. ; Riedel, R. (1995)
Polymer-derived Si-based bulk ceramics, Part II: microstructural charcterization by electron spectroscopic imaging.
In: Journal of the European Ceramic Society, 15 (8)
Artikel, Bibliographie

Bruley, J. ; Tanaka, I. ; Kleebe, H.-J. ; Rühle, M. (1994)
Chemistry of Grain-Boundaries in Calcia Doped Silicon-Nitride Studied by Spatially-Resolved Electron Energy-Loss Spectroscopy.
In: Analytica Chimica Acta, 297 (1-2)
doi: 10.1016/0003-2670(94)00058-1
Artikel, Bibliographie

Kleebe, H.-J. ; Bruley, J. ; Rühle, M. (1994)
HREM and AEM Studies of Yb2O3-Fluxed Silicon-Nitride Ceramics With and Without Cao Addition.
In: Journal of the European Ceramic Society, 14 (1)
doi: 10.1016/0955-2219(94)90038-8
Artikel, Bibliographie

Bruley, J. ; Höche, T. ; Kleebe, H.-J. ; Rühle, M. (1994)
Recent Attempts to Detect Magnesium in a Heavily Doped Sapphire Bicrystal by Spatially Resolved Electron Energy--Loss Spectroscopy.
In: Journal of the American Ceramic Society, 77 (9)
doi: 10.1111/j.1151-2916.1994.tb04593.x
Artikel, Bibliographie

Höche, T. ; Kenway, P. R. ; Kleebe, H.-J. ; Rühle, M. ; Morris, P. A. (1994)
The Structure of Special Grain-Boundaries in \textgreeka-Al2O3.
In: Journal of Physics and Chemistry of Solids, 55 (10)
doi: 10.1016/0022-3697(94)90125-2
Artikel, Bibliographie

Cinibulk, M. K. ; Kleebe, H.-J. ; Schneider, G. A. ; Rühle, M. (1993)
Amorphous Intergranular Films in Silicon-Nitride Ceramics Quenched from High-Temperatures.
In: Journal of the American Ceramic Society, 76 (11)
doi: 10.1111/j.1151-2916.1993.tb04019.x;
Artikel, Bibliographie

Cinibulk, M. K. ; Kleebe, H.-J. ; Rühle, M. (1993)
Quantitative Comparison of TEM Techniques for Determining Amorphous Intergranular Film Thickness.
In: Journal of the American Ceramic Society, 76 (2)
doi: 10.1111/j.1151-2916.1993.tb03801.x
Artikel, Bibliographie

Vetrano, J. S. ; Kleebe, H.-J. ; Hampp, E. ; Hoffmann, M. J. ; Rühle, M. ; Cannon, R. M. (1993)
Yb2O3-Fluxed Sintered Silicon Nitride, Part 1 Microstructure Characterization.
In: Journal of Materials Science, 28 (13)
doi: 10.1007/bf01159834
Artikel, Bibliographie

Kleebe, H.-J. ; Hoffmann, M. J. ; Rühle, M. (1992)
Influence of Secondary Phase Chemistry on Grain-Boundary Film Thickness in Silicon-Nitride.
In: International Journal of Materials Research = Zeitschrift für Metallkunde, 83 (8)
doi: 10.1515/ijmr-1992-830808
Artikel, Bibliographie

Konferenzveröffentlichung

Diemer, Matthias ; Hoffman, Mark ; Neubrand, Achim ; Rödel, Jürgen ; Müllejans, H. ; Rühle, M. (1997)
The role of oxygen partial presure on the wetting behaviour and the interface chemistry of copper-alumina interfaces.
Konferenzveröffentlichung, Bibliographie