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Yb2O3-Fluxed Sintered Silicon Nitride, Part 1 Microstructure Characterization

Vetrano, J. S. ; Kleebe, H.-J. ; Hampp, E. ; Hoffmann, M. J. ; Rühle, M. ; Cannon, R. M. (1993):
Yb2O3-Fluxed Sintered Silicon Nitride, Part 1 Microstructure Characterization.
In: Journal of Materials Science, 28 (13), pp. 3529-3538. Springer Nature, DOI: 10.1007/bf01159834,
[Article]

Item Type: Article
Erschienen: 1993
Creators: Vetrano, J. S. ; Kleebe, H.-J. ; Hampp, E. ; Hoffmann, M. J. ; Rühle, M. ; Cannon, R. M.
Title: Yb2O3-Fluxed Sintered Silicon Nitride, Part 1 Microstructure Characterization
Language: English
Journal or Publication Title: Journal of Materials Science
Journal volume: 28
Number: 13
Publisher: Springer Nature
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Earth Science
11 Department of Materials and Earth Sciences > Earth Science > Geo-Material-Science
Date Deposited: 17 Nov 2021 12:07
DOI: 10.1007/bf01159834
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