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Statistical-Analysis of the Intergranular Film Thickness In Silicon-Nitride Ceramics

Kleebe, H.-J. ; Cinibulk, M. K. ; Cannon, R. M. ; Rühle, M. (2005):
Statistical-Analysis of the Intergranular Film Thickness In Silicon-Nitride Ceramics.
In: Journal of the American Ceramic Society, 76 (8), pp. 1969-1977. ACS, DOI: 10.1111/j.1151-2916.1993.tb08319.x,
[Article]

Item Type: Article
Erschienen: 2005
Creators: Kleebe, H.-J. ; Cinibulk, M. K. ; Cannon, R. M. ; Rühle, M.
Title: Statistical-Analysis of the Intergranular Film Thickness In Silicon-Nitride Ceramics
Language: English
Journal or Publication Title: Journal of the American Ceramic Society
Journal volume: 76
Number: 8
Publisher: ACS
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Earth Science
11 Department of Materials and Earth Sciences > Earth Science > Geo-Material-Science
Date Deposited: 17 Nov 2021 12:07
DOI: 10.1111/j.1151-2916.1993.tb08319.x
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