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Number of items: 4.

Kleebe, H.-J. ; Cinibulk, M. K. ; Cannon, R. M. ; Rühle, M. (2005):
Statistical-Analysis of the Intergranular Film Thickness In Silicon-Nitride Ceramics.
In: Journal of the American Ceramic Society, 76 (8), pp. 1969-1977. ACS, DOI: 10.1111/j.1151-2916.1993.tb08319.x,
[Article]

Vetrano, J. S. ; Kleebe, H.-J. ; Hampp, E. ; Hoffmann, M. J. ; Rühle, M. ; Cannon, R. M. (1993):
Yb2O3-Fluxed Sintered Silicon Nitride, Part 1 Microstructure Characterization.
In: Journal of Materials Science, 28 (13), pp. 3529-3538. Springer Nature, DOI: 10.1007/bf01159834,
[Article]

Vetrano, J. S. ; Kleebe, H.-J. ; Hampp, E. ; Hoffmann, M. J. ; Cannon, R. M. (1992):
Epitaxial Deposition of Silicon-Nitride During Post-Sintering Heat-Treatment.
In: Journal of Materials Science Letters, 11 (18), pp. 1249-1252. Springer, DOI: 10.1007/BF00729782,
[Article]

Oh, T. S. ; Rödel, Jürgen ; Cannon, R. M. ; Ritchie, R. O. (1988):
Ceramic/metal interfacial crack growth: Toughening by controlled microcracks and interfacial geometries.
In: Acta Metallurgica, 36 (8), pp. 2083-2093. ISSN 00016160,
[Article]

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