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Number of items: 3.

Molina-Luna, Leopoldo and Wang, Shuai and Pivak, Y. and Zintler, Alexander and Perez-Garza, Hector H. and Spruit, Ronald G. and Xu, Qiang and Yi, Min and Xu, Bai-Xiang and Acosta, Matias (2018):
Enabling nanoscale flexoelectricity at extreme temperature by tuning cation diffusion.
In: Nature communications, 9, p. 4445. Nature, ISSN 2041-1723,
DOI: 10.1038/s41467-018-06959-8,

Perez-Garza, Hector H. and Pivak, Y. and Molina-Luna, Leopoldo and van Omme, J. T. and Spruit, Ronald G. and Sholkina, M. and Pen, M. and Xu, Q. (2017):
MEMS-Based sample carriers for simultaneous heating and biasing experiments: a platform for in-situ TEM analysis.
In: IEEE sensors letters Institute of Electrical and Electronics Engineers, pp. 18-22,
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, NJ 08855-4141 USA, 19th International Conference on Solid-State Sensors, Kaohsiung, Taiwan, 8-22 June 2017, DOI: 10.1109/TRANSDUCERS.2017.7994502,
[Conference or Workshop Item]

Pivak, Yevheniy and Perez-Garza, Hector H. and Zintler, Alexander and Molina-Luna, Leopoldo (2017):
Electrical characterization and failure analysis using operando TEM.
pp. 353-357, ASM INTERNATIONAL, 9503 KINSMAN RD, MATERIALS PARK, OH 44073 USA, ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis, Pasadena, Californien, USA, 5.9.2017, [Conference or Workshop Item]

This list was generated on Sat May 15 02:33:56 2021 CEST.