Petzold, S. ; Miranda, E. ; Sharath, S.U. ; Munos-Gorriz, J. ; Vogel, T. ; Piros, E. ; Kaiser, N. ; Eilhardt, Robert ; Zintler, Alexander ; Molina-Luna, Leopoldo ; Sune, J. ; Alff, Lambert (2019):
Analysis and simulation of the multiple resistive switching modes occurring in HfOx-based resistive random access memories using memdiodes.
In: Journal of Applied Physics, (125), p. 234503. ISSN 00218979,
DOI: 10.1063/1.5094864,
[Article]