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Dietz, C. and Zerson, M. and Riesch, C. and Gigler, A. M. and Stark, R. W. and Rehse, N. and Magerle, R. (2008):
Nanotomography with enhanced resolution using bimodal atomic force microscopy.
In: Appl. Phys. Lett., vol. 9, (art. 1), [Article]

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