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English

Kim-Ngan, Nhu-T. H. and Havela, L. and Adamska, A. M. and Danis, S. and Pesicka, J. and Macl, J. and Eloirdi, R. and Huber, F. and Gouder, T. and Balogh, A. G. (2011):
Characterization of U-based thin films: the UFe2+xcase.
In: Journal of Physics: Conference Series, 303 (1), pp. 012012. IOP Publishing, ISSN 1742-6596,
[Article]

Adamska, A. M. and Havela, L. and Danis, S. and Pesicka, J. and Macl, J. and Uhlirova, K. and Gouder, T. and Eloirdi, R. and Huber, F. and Kim-Ngan, N.-T. H. and Balogh, A. G. (2010):
Uranium compounds prepared by sputter deposition: UFe2+x.
In: Journal of Physics: Conference Series, 200 (1), pp. 012057. IOP Publishing, [Article]

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