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Group by: No Grouping | Item Type | Date | Language
Number of items: 8.

Grajal, J. ; Lin, C. I. ; Gonzalez, P. ; Krozer, V. (1999)
Optimization of doping profiles in Schottky diodes for millimeter frequency multipliers.
Conference or Workshop Item, Bibliographie

Grajal, J. ; Krozer, V. ; Maldonado, F. ; Gonzalez, E. ; Lin, C. I. ; Hartnagel, H. L. (1998)
Tripler circuit design with Schottky varactors.
Conference or Workshop Item, Bibliographie

Brandt, Michael ; Krozer, V. ; Schüßler, M. ; Lin, C. ; Simon, A. ; Vogt, A. ; Rodriguez-Girones Arboli, Manuel ; Parmeggiani, E. ; Grajal, J. (1998)
Application of transmission line pulsed (TLP) stress for thermal and reliability characterisation of compound semiconductor devices.
Reliability Center of Japan (RCJ) Symposium. Tokyo (1998)
Conference or Workshop Item, Bibliographie

Grajal, J. ; Krozer, V. ; Schuessler, M. ; Brandt, M. ; Hartnagel, Hans L. (1997)
Application of semiconductor interface modelling to reliability characterisation.
Conference or Workshop Item, Bibliographie

Grajal, J. ; Krozer, V. ; Gonzalez, P. ; Gismero, J. ; Maldonado, F. ; Lin, C. I. ; Simon, A. ; Hartnagel, H. L. (1997)
Characterization of Schottky diode performance by numerical simulation coupled with harmonic balance.
Conference or Workshop Item, Bibliographie

Lin, Chih-I. ; Krozer, V. ; Grajal, J. ; Simon, A. ; Hartnagel, H. L. (1997)
Schottky varactor diode optimation for frequency multipliers.
Conference or Workshop Item, Bibliographie

Brandt, Michael ; Schüßler, M. ; Krozer, V. ; Grajal, J. ; Hartnagel, H. L. (1997)
Transmission line pulse based reliability investigations of HBTs.
Conference or Workshop Item, Bibliographie

Grajal, J. ; Krozer, V. ; Hartnagel, H. L. ; Gismero, J. (1995)
Simulation of the influence of interface states on HBTs.
Conference or Workshop Item, Bibliographie

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