Artikel

Buschmann, Veronique ; Rodewald, M. ; Fuess, H. ; van Tendeloo, G. ; Schäffer, C. (1999)
High resolution electron microscopy study of molecular beam epitaxy grown CoSi2/Si1-xGex/Si(100) heterostructures.
In: Journal of applied physics, 85
Artikel, Bibliographie

Dissertation

Buschmann, Veronique (2008)
Structural characterisation of 2D- and 3D-nanostructures by means of High Resolution Electron Microscopy.
Technische Universität Darmstadt
Dissertation, Bibliographie