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Number of items: 8.

Weißgraeber, Philipp ; Rosendahl, Philipp Laurens
eds.: Bischoff, M. ; Scheven, M. von ; Oesterle, B. (2020)
Schneebrettlawinen – Kollaps poröser Schichten.
Baustatik – Baupraxis 14.
doi: 10.18419/opus-10762
Conference or Workshop Item, Bibliographie

Cao, Toan Duc ; Wang, Yongqi ; Sanavia, Lorenzo ; Schrefler, B. A.
eds.: Onate, E. ; Bischoff, M. ; Owen, D. R. J. ; Wriggers, P. ; Zohdi, T. (2015)
Mixed finite element formulation for non-isothermal porous media in dynamics.
In: Particle-based Methods – Fundamentals and Applications
Book Section, Bibliographie

Thiem, C. ; Schäfer, Michael
eds.: Mehl, Miriam ; Bischoff, M. ; Schäfer, Michael (2015)
Dynamic Two-Way Parallelization of Non-Intrusive Methods for Uncertainty Quantification.
In: Recent Trends in Computational Engineering – CE2014
Book Section, Bibliographie

Kneissl, S. ; Sternel, Dörte C. ; Schäfer, Michael
eds.: Mehl, Miriam ; Bischoff, M. ; Schäfer, Michael (2015)
Parallel Algorithm for Solution-Adaptive Grid Movement in the Context of Fluid-Structure Interaction.
In: Recent Trends in Computational Engineering – CE2014
Book Section, Bibliographie

Bauer, M. ; Bischoff, M. ; Jukresch, S. ; Hülsenbusch, T. ; Matern, A. ; Görtler, A. ; Stark, R. W. ; Chuvilin, A. ; Kaiser, U. (2009)
Exterior surface damage of calcium fluoride outcoupling mirrors for DUV lasers.
In: Optics Express, 17 (10)
doi: 10.1364/OE.17.008253
Article, Bibliographie

Bauer, M. ; Bischoff, M. ; Hülsenbusch, T. ; Matern, A. ; Stark, R. W. ; Kaiser, N. (2009)
Onset of the optical damage in CaF2 optics caused by deep-UV lasers.
In: Optics Letters, 34 (24)
doi: 10.1364/OL.34.003815
Article, Bibliographie

Horn, Joachim ; Marx, N. ; Weiss, B. L. ; Hartnagel, H. L. ; Stehle, M. ; Bischoff, M. ; Pagnia, H. (1995)
High resolution surface characterization using STM light emission techniques.
In: Passivation of metals and semiconductors
Book Section, Bibliographie

Stehle, M. ; Bischoff, M. ; Pagnia, H. ; Horn, Joachim ; Marx, N. ; Weiss, B. L. ; Hartnagel, H. L. (1995)
Time-resolved luminscence measurements on GaAs homostructures using pulse excitation of a scanning tunneling microscope.
In: Journal of Vacuum Science and Technology B, 13
doi: 10.1116/1.588370
Article, Bibliographie

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