Artikel

Zwiebler, M. ; Hamann-Borrero, J. E. ; Vafaee, M. ; Komissinskiy, P. ; Macke, S. ; Sutarto, R. ; He, F. ; Büchner, B. ; Sawatzky, G. A. ; Alff, L. ; Geck, J. (2015)
Electronic depth profiles with atomic layer resolution from resonant soft x-ray reflectivity.
In: New Journal of Physics, 17 (8)
doi: 10.1088/1367-2630/17/8/083046
Artikel, Bibliographie

Barreiro, A. ; Selbmann, D. ; Pichler, T. ; Biedermann, K. ; Gemming, T. ; Rümmeli, M. H. ; Schwalke, Udo ; Büchner, B. (2006)
On the Effects of Solution and Reaction Parameters for the Aerosol-assisted CVD Growth of Long Carbon Nanotubes.
In: Applied Physics A, 82 (4)
Artikel, Bibliographie