Zwiebler, M. ; Hamann-Borrero, J. E. ; Vafaee, M. ; Komissinskiy, P. ; Macke, S. ; Sutarto, R. ; He, F. ; Büchner, B. ; Sawatzky, G. A. ; Alff, L. ; Geck, J. (2015)
Electronic depth profiles with atomic layer resolution from resonant soft x-ray reflectivity.
In: New Journal of Physics, 17 (8)
doi: 10.1088/1367-2630/17/8/083046
Artikel, Bibliographie