TU Darmstadt / ULB / TUbiblio

Electronic depth profiles with atomic layer resolution from resonant soft x-ray reflectivity

Zwiebler, M. and Hamann-Borrero, J. E. and Vafaee, M. and Komissinskiy, P. and Macke, S. and Sutarto, R. and He, F. and Büchner, B. and Sawatzky, G. A. and Alff, L. and Geck, J. (2015):
Electronic depth profiles with atomic layer resolution from resonant soft x-ray reflectivity.
In: cond-mat.mes-hall, Cornell University Library, [Article]

Abstract

The analysis of x-ray reflectivity data from artificial heterostructures usually relies on the homogeneity of optical properties of the constituent materials. However, when the x-ray energy is tuned to an absorption edge, this homogeneity no longer exists. Within the same material, spatial regions containing elements at resonance will have optical properties very different from regions without resonating sites. In this situation, models assuming homogenous optical properties throughout the material can fail to describe the reflectivity adequately. As we show here, resonant soft x-ray reflectivity is sensitive to these variations, even though the wavelength is typically large as compared to the atomic disances over which the optical properties vary. We have therefore developed a scheme for analyzing resonant soft x-ray reflectivity data, which takes the atomic structure of a material into account by "slicing" it into atomic planes with characteristic optical properties. Using LaSrMnO4 as an example, we discuss both the theoretical and experimental implications of this approach. Our analysis not only allows to determine important structural information such as interface terminations and stacking of atomic layers, but also enables to extract depth-resolved spectroscopic information with atomic resolution, thus enhancing the capability of the technique to study emergent phenomena at surfaces and interfaces.

Item Type: Article
Erschienen: 2015
Creators: Zwiebler, M. and Hamann-Borrero, J. E. and Vafaee, M. and Komissinskiy, P. and Macke, S. and Sutarto, R. and He, F. and Büchner, B. and Sawatzky, G. A. and Alff, L. and Geck, J.
Title: Electronic depth profiles with atomic layer resolution from resonant soft x-ray reflectivity
Language: English
Abstract:

The analysis of x-ray reflectivity data from artificial heterostructures usually relies on the homogeneity of optical properties of the constituent materials. However, when the x-ray energy is tuned to an absorption edge, this homogeneity no longer exists. Within the same material, spatial regions containing elements at resonance will have optical properties very different from regions without resonating sites. In this situation, models assuming homogenous optical properties throughout the material can fail to describe the reflectivity adequately. As we show here, resonant soft x-ray reflectivity is sensitive to these variations, even though the wavelength is typically large as compared to the atomic disances over which the optical properties vary. We have therefore developed a scheme for analyzing resonant soft x-ray reflectivity data, which takes the atomic structure of a material into account by "slicing" it into atomic planes with characteristic optical properties. Using LaSrMnO4 as an example, we discuss both the theoretical and experimental implications of this approach. Our analysis not only allows to determine important structural information such as interface terminations and stacking of atomic layers, but also enables to extract depth-resolved spectroscopic information with atomic resolution, thus enhancing the capability of the technique to study emergent phenomena at surfaces and interfaces.

Journal or Publication Title: cond-mat.mes-hall
Publisher: Cornell University Library
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Advanced Thin Film Technology
Date Deposited: 21 Apr 2015 10:45
Identification Number: arXiv:1501.03388
Funders: M. Zwiebler, J. E. Hamann-Borrero and J. Geck gratefully acknowledge the support through the 18 DFG Emmy Noether Program (Grants GE-1647/2-1 and HA6470/1-1). , Experiments described in this paper were performed at the Canadian Light Source, which is funded by the CFI, NSERC, NRC, CIHR, the Government of Saskatchewan, WD Canada and the University of Saskatchewan.
Export:

Optionen (nur für Redakteure)

View Item View Item