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Zwiebler, M. and Hamann-Borrero, J. E. and Vafaee, M. and Komissinskiy, P. and Macke, S. and Sutarto, R. and He, F. and Büchner, B. and Sawatzky, G. A. and Alff, L. and Geck, J. (2015):
Electronic depth profiles with atomic layer resolution from resonant soft x-ray reflectivity.
In: cond-mat.mes-hall, Cornell University Library, [Article]

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