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Number of items: 2.

Zwiebler, M. and Hamann-Borrero, J. E. and Vafaee, M. and Komissinskiy, P. and Macke, S. and Sutarto, R. and He, F. and Büchner, B. and Sawatzky, G. A. and Alff, L. and Geck, J. (2015):
Electronic depth profiles with atomic layer resolution from resonant soft x-ray reflectivity.
In: cond-mat.mes-hall, Cornell University Library, [Article]

Barreiro, A. and Selbmann, D. and Pichler, T. and Biedermann, K. and Gemming, T. and Rümmeli, M. H. and Schwalke, Udo and Büchner, B. (2006):
On the Effects of Solution and Reaction Parameters for the Aerosol-assisted CVD Growth of Long Carbon Nanotubes.
In: Applied Physics A, 82 (4), pp. 719-725. [Article]

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