Zwiebler, M. ; Hamann-Borrero, J. E. ; Vafaee, M. ; Komissinskiy, P. ; Macke, S. ; Sutarto, R. ; He, F. ; Büchner, B. ; Sawatzky, G. A. ; Alff, L. ; Geck, J. (2015):
Electronic depth profiles with atomic layer resolution from resonant soft x-ray reflectivity.
In: cond-mat.mes-hall, Cornell University Library, [Article]

Barreiro, A. ; Selbmann, D. ; Pichler, T. ; Biedermann, K. ; Gemming, T. ; Rümmeli, M. H. ; Schwalke, Udo ; Büchner, B. (2006):
On the Effects of Solution and Reaction Parameters for the Aerosol-assisted CVD Growth of Long Carbon Nanotubes.
In: Applied Physics A, 82 (4), pp. 719-725. [Article]