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Number of items: 4.

Cassinelli, M. and Müller, S. and Voss, K.-O. and Trautmann, C. and Völklein, F. and Gooth, J. and Nielsch, K. and Toimil-Molares, M. E. (2017):
Influence of surface states and size effects on the Seebeck coefficient and electrical resistance of Bi1−xSbxnanowire arrays.
In: Nanoscale, Royal Society of Chemistry, pp. 3169-3179, 9, (9), ISSN 2040-3364,
DOI: 10.1039/C6NR09624G,
[Online-Edition: https://doi.org/10.1039/C6NR09624G],
[Article]

Assmann, W. and Ban-d'Etat, B. and Bender, M. and Boduch, P. and Grande, P. L. and Lebius, H. and Lelièvre, D. and Marmitt, G. G. and Rothard, H. and Seidl, T. and Severin, D. and Voss, K.-O. and Toulemonde, M. and Trautmann, C. (2017):
Charge-state related effects in sputtering of LiF by swift heavy ions.
In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier Science Publishing, pp. 94-101, 392, ISSN 0168583X,
DOI: 10.1016/j.nimb.2016.12.013,
[Online-Edition: https://doi.org/10.1016/j.nimb.2016.12.013],
[Article]

Merk, B. and Voss, K.-O. and Müller, I. and Fischer, B. E. and Jakob, B. and Taucher-Scholz, G. and Trautmann, C. and Durante, M. (2013):
Photobleaching setup for the biological end-station of the darmstadt heavy-ion microprobe.
In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier Science Publishing, pp. 81-84, 306, ISSN 0168583X,
[Online-Edition: http://dx.doi.org/10.1016/j.nimb.2012.11.043],
[Article]

Toulemonde, M. and Benyagoub, A. and Trautmann, C. and Khalfaoui, N. and Boccanfuso, M. and Dufour, C. and Gourbilleau, F. and Grob, J. and Stoquert, J. and Costantini, J. and Haas, F. and Jacquet, E. and Voss, K.-O. and Meftah, A. (2013):
Reply to “Comment on ‘Dense and nanometric electronic excitations induced by swift heavy ions in an ionic CaF2 crystal: Evidence for two thresholds of damage creation’ ”.
In: Physical Review B, American Physical Society, 87, (5), ISSN 1098-0121,
[Online-Edition: http://dx.doi.org/10.1103/PhysRevB.87.056102],
[Article]

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