ULB

TUbiblio

Browse by Person

Group by: No Grouping | Item Type | Date | Language

Number of items: 1.

Article

Schuessler, M. ; Krozer, ; Bock, ; Brandt, ; Vecchi, ; Losi, ; Hartnagel, Hans L. (1996):
Pulsed stress reliability investigations of Schottky diodes and HBTs.
In: Microelectronics and reliability. 36 (1996), S. 1907-1910, [Article]

This list was generated on Tue May 17 00:27:28 2022 CEST.

OAI 2.0-Basis-URL: https://tubiblio.ulb.tu-darmstadt.de/cgi/oai2 TUbiblio verwendet EPrints 3.

Drucken |

Impressum |

Datenschutzerklärung