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Number of items: 3.

Dehé, Alfons and Pavlidis, and Hong, and Hartnagel, (1997):
InGaAs/InP thermoelectric infrared sensor utilizing surface bulk micromachining technology.
In: IEEE Transactions on electron devices. 44 (1997), 6, S. 1193-1199, [Article]

Dehé, Alfons and Hartnagel, and Pavlidis, and Hong, and Kuphal, (1996):
Properties of InGaAs/InP thermoelectric and surface bulk micromachined infrared sensors.
In: Applied physics letters. 69 (1996), S. 3039-3041, [Article]

Horn, Joachim and Pavlidis, and Park, and Hartnagel, (1996):
Scanning tunneling microscopy characterization of MOCVD grown GaN.
In: EXMATEC: International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies <3, 1996, Breisgau>: Proceedings, [Conference or Workshop Item]

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