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Number of items: 4.

Horn, Joachim and Pavlidis, and Park, and Hartnagel, (1996):
Scanning tunneling microscopy characterization of MOCVD grown GaN.
In: EXMATEC: International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies <3, 1996, Breisgau>: Proceedings, [Conference or Workshop Item]

Klös, Hans-Joachim and Park, (1995):
Einfluß der verwendeten Harz/Härter/Füllstoff-Komponenten auf die Oberflächenalterung von Gießharzformstoffen bei Belastung mit feuchter Fremdschicht und hoher elektrischer Feldstärke.
In: Epoxidharze in der Elektrotechnik, Lehrgangsbeitrag Nr. 15, Esslingen: Techn. Akademie, 1995,
Esslingen, Techn. Akademie, [Other]

Klös, Hans-Joachim and Park, and König, (1995):
Experience with aging and humidity tests according to IEC report 932.
In: Conference on Electrical Insulation and Dielectric Phenomena: Annual report 1995. S. 282-285, [Conference or Workshop Item]

Klös, Hans-Joachim and Kaltenborn, and Park, and König, (1995):
The performance of model switchgear, real switchgear panels and dry-type power transformers under humidity and pollution tests according to IEC report 932.
Berlin (u.a.), VDE-Verl, In: International Symposium High Voltage Technology <9, 1995, Graz>: Proceedings. S. 3916-1...4, [Conference or Workshop Item]

This list was generated on Tue Jul 16 01:10:59 2019 CEST.