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Thermal simulation and characterisation of the reliability of terahertz Schottky diodes

Brandt, Michael and Schüßler, and Parmeggiani, and Lin, and Simon, and Hartnagel, (1997):
Thermal simulation and characterisation of the reliability of terahertz Schottky diodes.
In: European Symposium of Electron Devices, Failure Physics and Analysis <8, 1997, Arcachon, France>: Proceedings. S. 1663-1666, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 1997
Creators: Brandt, Michael and Schüßler, and Parmeggiani, and Lin, and Simon, and Hartnagel,
Title: Thermal simulation and characterisation of the reliability of terahertz Schottky diodes
Language: English
Series Name: European Symposium of Electron Devices, Failure Physics and Analysis <8, 1997, Arcachon, France>: Proceedings. S. 1663-1666
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:04
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