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Tiginyanu, I. and Kravetsky, I. and Pavlidis, D. and Eisenbach, A. and Hildebrandt, R. and Marowsky, G. and Hartnagel, H. L. (2000):
Nonlinear optical characterization of GaN layers grown by MOCVD on sapphire.
In: MRS Internet journal nitride semiconductor research. 5S1, W11.52 (2000), [Article]

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