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Sharath, S. U. and Joseph, M. J. and Vogel, S. and Hildebrandt, E. and Komissinskiy, P. and Kurian, J. and Schroeder, T. and Alff, L. (2016):
Impact of oxygen stoichiometry on electroforming and multiple switching modes in TiN/TaOx/Pt based ReRAM.
In: Applied Physics Letters, AIP Publishing, p. 173503, 109, (17), ISSN 0003-6951,
[Online-Edition: http://doi.org/10.1063/1.4965872],
[Article]

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