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Alaei, H. R. and Eshghi, H. and Riedel, R. and Pavlidis, D. (2010):
Thermal Stress and Strain in a GaN Epitaxial Layer Grown on a Sapphire Substrate by the MOCVD Method.
In: Chinese Journal of Physics, 48 (3), pp. 400-407, [Article]

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