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Alaei, H. R. ; Eshghi, H. ; Riedel, R. ; Pavlidis, D. (2010):
Thermal Stress and Strain in a GaN Epitaxial Layer Grown on a Sapphire Substrate by the MOCVD Method.
In: Chinese Journal of Physics, 48 (3), pp. 400-407. [Article]

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