Rispal, Lorraine and Stefanov, Yordan and Wessely, Frank and Schwalke, Udo (2006):
Carbon Nanotube Transistor Fabrication Assisted by Topographical and Conductive Atomic Force Microscopy.
In: Japanese Journal of Applied Physics, pp. 3672-3679, 45, [Online-Edition: http://dx.doi.org/10.1143/JJAP.45.3672],
[Article]
Official URL: http://dx.doi.org/10.1143/JJAP.45.3672
| Item Type: | Article |
|---|---|
| Erschienen: | 2006 |
| Creators: | Rispal, Lorraine and Stefanov, Yordan and Wessely, Frank and Schwalke, Udo |
| Title: | Carbon Nanotube Transistor Fabrication Assisted by Topographical and Conductive Atomic Force Microscopy |
| Language: | English |
| Journal or Publication Title: | Japanese Journal of Applied Physics |
| Volume: | 45 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
| Date Deposited: | 20 Nov 2008 08:26 |
| Official URL: | http://dx.doi.org/10.1143/JJAP.45.3672 |
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