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Carbon Nanotube Transistor Fabrication Assisted by Topographical and Conductive Atomic Force Microscopy

Rispal, Lorraine and Stefanov, Yordan and Wessely, Frank and Schwalke, Udo (2006):
Carbon Nanotube Transistor Fabrication Assisted by Topographical and Conductive Atomic Force Microscopy.
In: Japanese Journal of Applied Physics, pp. 3672-3679, 45, [Online-Edition: http://dx.doi.org/10.1143/JJAP.45.3672],
[Article]

Item Type: Article
Erschienen: 2006
Creators: Rispal, Lorraine and Stefanov, Yordan and Wessely, Frank and Schwalke, Udo
Title: Carbon Nanotube Transistor Fabrication Assisted by Topographical and Conductive Atomic Force Microscopy
Language: English
Journal or Publication Title: Japanese Journal of Applied Physics
Volume: 45
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics
Date Deposited: 20 Nov 2008 08:26
Official URL: http://dx.doi.org/10.1143/JJAP.45.3672
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