Rispal, Lorraine and Stefanov, Yordan and Wessely, Frank and Schwalke, Udo (2006):
Carbon Nanotube Transistor Fabrication Assisted by Topographical and Conductive Atomic Force Microscopy.
In: Japanese Journal of Applied Physics, 45, pp. 3672-3679. [Article]
Official URL: http://dx.doi.org/10.1143/JJAP.45.3672
Item Type: | Article |
---|---|
Erschienen: | 2006 |
Creators: | Rispal, Lorraine and Stefanov, Yordan and Wessely, Frank and Schwalke, Udo |
Title: | Carbon Nanotube Transistor Fabrication Assisted by Topographical and Conductive Atomic Force Microscopy |
Language: | English |
Journal or Publication Title: | Japanese Journal of Applied Physics |
Journal volume: | 45 |
Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
Date Deposited: | 20 Nov 2008 08:26 |
Official URL: | http://dx.doi.org/10.1143/JJAP.45.3672 |
Export: | |
Suche nach Titel in: | TUfind oder in Google |
![]() |
Send an inquiry |
Options (only for editors)
![]() |
Show editorial Details |