1997

Vogt, A. ; Brandt, M. ; Sigurdardottir, A. ; Schüssler, M. ; Pena, D. ; Simon, A. ; Hartnagel, H. L. ; Rodewald, M. ; Roesner, M. ; Fuess, H. ; Goswami, S. N. N. ; Lal, K. (1997)
Characterisation of degradation mechanisms in resonant tunnelling diodes.
In: Microelectronics Reliability, 37 (10-11)
doi: 10.1016/S0026-2714(97)00141-8
Artikel, Bibliographie

1995

Borgarino, Mattia ; Menozzi, R. ; Fantini, Fausto ; Schüssler, M. ; Hartnagel, H. L. (1995)
High base current ideality factors due to trap-assisted band-to-band tunneling in AlGaAs/GaAs HBTs.
In: Alta frequenza, 7
Artikel, Bibliographie