Englisch

Recalde-Benitez, Oscar ; Pivak, Yevheniy ; Winkler, Robert ; Jiang, Tianshu ; Adabifiroozjaei, Esmaeil ; Perez-Garza, H. Hugo ; Molina-Luna, Leopoldo (2024)
Multi-stimuli operando transmission electron microscopy for two-terminal oxide-based devices.
In: Microscopy and Microanalysis
doi: 10.1093/mam/ozae023
Artikel, Bibliographie

Recalde-Benitez, Oscar ; Pivak, Yevheniy ; Jiang, Tianshu ; Winkler, Robert ; Zintler, Alexander ; Adabifiroozjaei, Esmaeil ; Komissinskiy, Philipp ; Alff, Lambert ; Hubbard, William A. ; Perez-Garza, H. Hugo ; Molina-Luna, Leopoldo (2024)
Weld-freemounting of lamellae for electrical biasing operando TEM.
In: Ultramicroscopy, 260
doi: 10.1016/j.ultramic.2024.113939
Artikel, Bibliographie

Recalde-Benitez, Oscar ; Jiang, Tianshu ; Winkler, Robert ; Ruan, Yating ; Zintler, Alexander ; Adabifiroozjaei, Esmaeil ; Arzumanov, Alexey ; Hubbard, William A. ; Omme, Tijn van ; Pivak, Yevheniy ; Perez-Garza, Hector H. ; Regan, B.C. ; Alff, Lambert ; Komissinskiy, Philipp ; Molina-Luna, Leopoldo (2023)
Operando two-terminal devices inside a transmission electron microscope.
In: Communications Engineering, 2
doi: 10.1038/s44172-023-00133-9
Artikel, Bibliographie

Pivak, Yevheniy ; Perez-Garza, Hector H. ; Zintler, Alexander ; Molina-Luna, Leopoldo (2017)
Electrical characterization and failure analysis using operando TEM.
ISTFA 2017: Proceedings from the 43rd International Symposium for Testing and Failure Analysis. Pasadena, Californien, USA (5.9.2017)
Konferenzveröffentlichung, Bibliographie