Peter, D. ; Dalmer, M. ; Kruwinus, H. ; Lechner, A. ; Archer, L. ; Gaulhofer, E. ; Gigler, A. M. ; Stark, R. W. ; Bensch, W. (2009)
Measurement of the mechanical stability of semiconductor line structures in relevant media.
doi: 10.1149/1.3108349
Conference or Workshop Item, Bibliographie