Zintler, Alexander ; Eilhardt, Robert ; Wang, Shuai ; Krajnak, Matus ; Schramowski, Patrick ; Stammer, Wolfgang ; Petzold, Stefan ; Kaiser, Nico ; Kerstling, Kristian ; Alff, Lambert ; Molina-Luna, Leopoldo (2020):
Machine Learning Assisted Pattern Matching: Insight into Oxide Electronic Device Performance by Phase Determination in 4D-STEM Datasets.
In: Microscopy and Microanalysis, 2020, pp. 1-3. Cambridge University Press, ISSN 1431-9276, e-ISSN 1435-8115,
DOI: 10.1017/S1431927620019790,
[Article]