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Biethan, Jens-Peter ; Kammler, Thorsten ; Naumann, Andreas ; Schwalke, Udo ; Stephan, Rolf ; Trui, Bernhard (2007)
New Results in Calculating Critical Thickness and the Degree of Relaxation for Epitaxial Grown Silicon-Germanium Layers on Silicon.
In: Book of Abstracts: E-MRS Fall Meeting 2007
Article, Bibliographie
Wei, Andy ; Kammler, Thorsten ; Häntschel, Jan ; Bierstedt, Helmut ; Biethan, Jens-Peter ; Hellmich, A. ; Hempel, K. ; Klais, J. ; Koerner, G. ; Lenski, Markus ; Mantei, T. ; Neu, A. ; Otterbach, R. ; Reichel, Carsten ; Trui, Bernhard ; Burbach, G. ; Feudel, T. ; Javorka, P. ; Schwan, C. ; Kepler, Nick ; Engelmann, H. J. ; Ziemer-Popp, C. ; Herzog, O. ; Greenlaw, David ; Raab, M. ; Stephan, Rolf ; Horstmann, M. ; Hansson, P. O. ; Samoilov, A. ; Sanchez, E. ; Luckner, O. ; Weiher-Telford, S. (2005)
Combining Embedded and Overlayer Compressive Stressors in Advanced SOI CMOS Technologies.
Kobe (Japan) (September 13 - 15, 2005)
Conference or Workshop Item, Bibliographie