2000

Lal, K. ; Hartnagel, H. L. ; Goswami, N. ; Thoma, P. (2000)
Experimental evaluation of on-chip measurement of charge transfer by X-rays.
In: Electronics letters, 36
Artikel, Bibliographie

1999

Lal, K. ; Goswami, N. ; Miao, J. ; Hartnagel, H. L. (1999)
High-resolution X-ray diffraction study of free-standing gallium arsenide coiled membrane force sensors produced by micromachining.
In: Indo-Russian Workshop on Micromechanical Systems
Buchkapitel, Bibliographie

Lal, K. ; Goswami, N. ; Miao, J. ; Hartnagel, H. L. (1999)
Structural characterization of free-standing gallium arsenide coiled membranes produced by micromachining.
In: Journal of applied crystallography, 32
Artikel, Bibliographie