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Number of items: 3.

Lal, K. and Hartnagel, H. L. and Goswami, N. and Thoma, P. (2000):
Experimental evaluation of on-chip measurement of charge transfer by X-rays.
In: Electronics letters, 36, [Article]

Lal, K. and Goswami, N. and Miao, J. and Hartnagel, H. L. (1999):
High-resolution X-ray diffraction study of free-standing gallium arsenide coiled membrane force sensors produced by micromachining.
In: Indo-Russian Workshop on Micromechanical Systems = SPIE Proceedings. Vol. 3903 (1999), [Conference or Workshop Item]

Lal, K. and Goswami, N. and Miao, J. and Hartnagel, H. L. (1999):
Structural characterization of free-standing gallium arsenide coiled membranes produced by micromachining.
In: Journal of applied crystallography, 32, [Article]

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