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Peter, D. and Dalmer, M. and Kruwinus, H. and Lechner, A. and Archer, L. and Gaulhofer, E. and Gigler, A. M. and Stark, R. W. and Bensch, W. (2009):
Measurement of the mechanical stability of semiconductor line structures in relevant media.
In: Vol. 16, iss. 4, In: ECS Trans, p. 13,
[Conference or Workshop Item]

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