2007

Wali, Y. ; Njeh, Anouar ; Wieder, Thomas ; Ben Ghozlen, M. H. (2007)
The Effect of depth-dependent Residual Stresses on the Propagation Behavior of Surface Acoustic Waves in thin Ag films on Si.
In: NDT and E International, 40 (7)
doi: 10.1016/j.ndteint.2007.02.004
Artikel, Bibliographie

2004

Njeh, Anouar ; Wieder, Thomas ; Ben Ghozlen, M. H. ; Fuess, Hartmut (2004)
An intensity correction for pole figure measurements by grazing incident and grazing exit angle X-ray diffraction.
In: Materials characterization, 52
Artikel, Bibliographie

2002

Njeh, Anouar ; Wieder, Thomas ; Schneider, D. ; Fuess, Hartmut ; Ben Ghozlen, M. H. (2002)
Surface wave propagation in thin silver films under residual stress.
In: Zeitschrift für Naturforschung / A, 57
Artikel, Bibliographie