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Nanotomography with enhanced resolution using bimodal atomic force microscopy

Dietz, C. ; Zerson, M. ; Riesch, C. ; Gigler, A. M. ; Stark, R. W. ; Rehse, N. ; Magerle, R. (2008)
Nanotomography with enhanced resolution using bimodal atomic force microscopy.
In: Applied Physics Letters, 92 (14)
doi: 10.1063/1.2907500
Article, Bibliographie

Item Type: Article
Erschienen: 2008
Creators: Dietz, C. ; Zerson, M. ; Riesch, C. ; Gigler, A. M. ; Stark, R. W. ; Rehse, N. ; Magerle, R.
Type of entry: Bibliographie
Title: Nanotomography with enhanced resolution using bimodal atomic force microscopy
Language: English
Date: 2008
Publisher: American Institute of Physics
Journal or Publication Title: Applied Physics Letters
Volume of the journal: 92
Issue Number: 14
DOI: 10.1063/1.2907500
Divisions: Zentrale Einrichtungen
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Date Deposited: 08 Jun 2010 07:01
Last Modified: 28 Apr 2020 07:40
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