Dietz, C. ; Zerson, M. ; Riesch, C. ; Gigler, A. M. ; Stark, R. W. ; Rehse, N. ; Magerle, R. (2008):
Nanotomography with enhanced resolution using bimodal atomic force microscopy.
In: Applied Physics Letters, 92 (14), p. 143107. American Institute of Physics, ISSN 0003-6951,
DOI: 10.1063/1.2907500,
[Article]
| Item Type: | Article |
|---|---|
| Erschienen: | 2008 |
| Creators: | Dietz, C. ; Zerson, M. ; Riesch, C. ; Gigler, A. M. ; Stark, R. W. ; Rehse, N. ; Magerle, R. |
| Title: | Nanotomography with enhanced resolution using bimodal atomic force microscopy |
| Language: | English |
| Journal or Publication Title: | Applied Physics Letters |
| Volume of the journal: | 92 |
| Issue Number: | 14 |
| Publisher: | American Institute of Physics |
| Divisions: | Zentrale Einrichtungen ?? fb99_csi~fg5 ?? |
| Date Deposited: | 08 Jun 2010 07:01 |
| DOI: | 10.1063/1.2907500 |
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