Petzold, S. ; Zintler, Alexander ; Eilhardt, Robert ; Piros, E. ; Kaiser, N. ; Sharath, S. U. ; Vogel, T. ; Major, M. ; McKenna, K. P. ; Molina-Luna, Leopoldo ; Alff, Lambert (2019):
Forming‐Free Grain Boundary Engineered Hafnium Oxide Resistive Random Access Memory Devices.
In: Advanced Electronic Materials, 25 (S2), pp. 1842-1843. WILEY, ISSN 2199160X,
DOI: 0.1017/S1431927619009942,
[Article]
| Item Type: | Article |
|---|---|
| Erschienen: | 2019 |
| Creators: | Petzold, S. ; Zintler, Alexander ; Eilhardt, Robert ; Piros, E. ; Kaiser, N. ; Sharath, S. U. ; Vogel, T. ; Major, M. ; McKenna, K. P. ; Molina-Luna, Leopoldo ; Alff, Lambert |
| Title: | Forming‐Free Grain Boundary Engineered Hafnium Oxide Resistive Random Access Memory Devices |
| Language: | English |
| Journal or Publication Title: | Advanced Electronic Materials |
| Volume of the journal: | 25 |
| Issue Number: | S2 |
| Publisher: | WILEY |
| Divisions: | 11 Department of Materials and Earth Sciences 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences > Material Science > Advanced Electron Microscopy (aem) 11 Department of Materials and Earth Sciences > Material Science > Advanced Thin Film Technology |
| Date Deposited: | 14 Aug 2019 12:54 |
| DOI: | 0.1017/S1431927619009942 |
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