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Analysis and simulation of the multiple resistive switching modes occurring in HfOx-based resistive random access memories using memdiodes

Petzold, S. ; Miranda, E. ; Sharath, S.U. ; Munos-Gorriz, J. ; Vogel, T. ; Piros, E. ; Kaiser, N. ; Eilhardt, Robert ; Zintler, Alexander ; Molina-Luna, Leopoldo ; Sune, J. ; Alff, Lambert (2019)
Analysis and simulation of the multiple resistive switching modes occurring in HfOx-based resistive random access memories using memdiodes.
In: Journal of Applied Physics, (125)
doi: 10.1063/1.5094864
Article, Bibliographie

Item Type: Article
Erschienen: 2019
Creators: Petzold, S. ; Miranda, E. ; Sharath, S.U. ; Munos-Gorriz, J. ; Vogel, T. ; Piros, E. ; Kaiser, N. ; Eilhardt, Robert ; Zintler, Alexander ; Molina-Luna, Leopoldo ; Sune, J. ; Alff, Lambert
Type of entry: Bibliographie
Title: Analysis and simulation of the multiple resistive switching modes occurring in HfOx-based resistive random access memories using memdiodes
Language: English
Date: May 2019
Journal or Publication Title: Journal of Applied Physics
Issue Number: 125
DOI: 10.1063/1.5094864
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Advanced Electron Microscopy (aem)
Date Deposited: 26 Jun 2019 05:26
Last Modified: 26 Jun 2019 05:26
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