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Horn, Joachim and Marx, and Weiss, and Hartnagel, and Stehle, and Bischoff, and Pagnia, (1995):
High resolution surface characterization using STM light emission techniques.
In: Passivation of metals and semiconductors. Hrsg.: K.E. Heusler. S. 145-154, Aedermannsdorf, Trans Tech Publ, [Book Section]

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