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Schwalke, Udo and Pölzl, Martin and Sekinger, Thomas and Kerber, Martin (2001):
Ultra-Thick Gate Oxides: Charge Generation and Its Iimpact on Reliability.
In: Microelectronics Reliability, pp. 1007-1010, 41, (7), [Online-Edition: http://dx.doi.org/10.1016/S0026-2714(01)00058-0],
[Article]

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