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Characterisation of degradation mechanisms in resonant tunneling diodes.
In: European Symposium of Electron Devices, Failure Physics and Analysis <8, 1997, Arcachon, France>: Proceedings. S. 1691-1694, [Conference or Workshop Item]

Vogt, Alexander ; Brandt, ; Sigurdardottir, A. ; Schüssler, ; Pena, ; Simon, ; Hartnagel, H. L. ; Rodewald, ; Roesner, (1997):
Characterisation of degradation mechanisms in resonant tunnelling diodes.
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Vogt, Alexander ; Brandt, ; Pena, ; Aller, ; Hartnagel, (1996):
Wachstum und Zuverlässigkeit von resonanten Tunneldioden.
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