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Number of items: 5.

Horn, Joachim and Vogt, and Aller, and Hartnagel, :
Semiconductor heterostructure interface characterization using scanning tunneling microscope excited time-resolved luminescence.
In: Journal of vacuum science and technology. B 14 (1996), S. 820-823
[Article], (1996)

Mutamba, Kabula and Sigurdardottir, A. and Miao, J. and Dehé, A. and Aller, and Hartnagel, H.L. :
Uniaxial stress dependence of AlGaAs/GaAs RTD characteristics for sensor applications.
In: Micromechanics Europe Conference <1996, Barcelona, Spain>: Proceedings. S. 85 .
[Conference or Workshop Item], (1996)

Vogt, Alexander and Brandt, and Pena, and Aller, and Hartnagel, :
Wachstum und Zuverlässigkeit von resonanten Tunneldioden.
In: Molecular Beam Epitaxy Workshop <1996, Frankfurt/Oder>: Proceedings .
[Conference or Workshop Item], (1996)

Stöcker, Jörg and Kirschbaum, and Aller, and Breuer, and Glesner, and Hartnagel, :
Der "intelligente" Reifen: Zwischenergebnis einer interdisziplinären Forschungskooperation.
In: Automobiltechnische Zeitschrift. 97 (1995), H. 12, S. 824-832
[Article], (1995)

Chattopadhyay, S. N. and Aller, and Hartnagel, :
Detailed transport modelling of experimental behaviour of lightly plasma damaged epitaxial InP.
In: International journal of electronics. 79 (1995), Nr. 5, S. 561-575
[Article], (1995)

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