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Schwarz, Mike and Calvet, Laurie E. and Snyder, John P. and Krauss, Tillmann and Schwalke, Udo and Kloes, Alexander (2017):
On the Physical Behavior of Cryogenic IV and III-V Schottky Barrier MOSFET Devices.
In: IEEE Transactions on Electron Devices, pp. 1-8, 99, [Online-Edition: https://doi.org/10.1109/TED.2017.2726899],
[Article]
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