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Schwarz, Mike ; Calvet, Laurie E. ; Snyder, John P. ; Krauss, Tillmann ; Schwalke, Udo ; Kloes, Alexander :
On the Physical Behavior of Cryogenic IV and III-V Schottky Barrier MOSFET Devices.
[Online-Edition: https://doi.org/10.1109/TED.2017.2726899]
In: IEEE Transactions on Electron Devices, 99 pp. 1-8.
[Artikel], (2017)