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Klein, Andreas and Fritsche, J. and Jaegermann, W. and Schön, J. H. and Kloc, C. and Bucher, E. (2000):
Fermi level dependent defect formation at Cu(In,Ga)Se2 interfaces.
In: Applied Surface Science, 166 (1-4), pp. 508-512, ISSN 01694332,
[Article]

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